The Transmission Electron Microscopy TEM laboratory is a state-of-the-art facility equipped with a FEI Tecnai G2 F20 X-Twin transmission electron microscope and a FEI FIB200TEM Focused Ion Beam device for specimen preparation. The laboratory provides powerful techniques for characterization of crystal structure, microstructures and chemical composition of materials down to a near atomic level.
TEM and attachments:
TEM sample holder:
FEI Helios G4 Dual Beam Helios G4 UC is part of the fourth generation of the leading Helios Dual Beam family. It combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Tomahawk ion column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion optics, the Helios G4 UC incorporates a suite of state-of-the-art technologies that enable simple and consistent high-resolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.
Highest quality TEM sample preparation:
The latest technological innovations of the Helios G4, in combination with the easiest to use, comprehensive software and FEI’s application expertise, allow for the fastest and easiest preparation of HR-S/TEM samples for a wide range of materials. In order to achieve the highest-quality results, final polishing with low energy ions is required to minimize surface damage on the sample. FEI’s Tomahawk Focused Ion Beam (FIB) column not only delivers high-resolution imaging and milling at high voltages, but has also excellent low voltage performance, enabling the creation of high quality TEM lamella.
Fastest and easiest TEM sample preparation
Shortest time to Nano scale information
Reveal the finest details
Precise sample navigation
Artifact-free imaging Fast, accurate and precise milling
Specifications and Detectors:
Elstar extreme high-resolution field emission SEM column.
Resolution: 0.6 nm at 30 kV STEM, 0.7 nm at 1 kV, 1.0 nm at 500 V (ICD).
Electron beam current range: 0.8 pA to 100 nA
Accelerating voltage range: 200 V to 30 kV
Maximum horizontal field width: 2.3 mm at 4 mm WD
Ion beam current range: 0.1 pA to 65 nA
Accelerating Voltage range: 500 V to 30 kV
Elstar in-lens SE/BSE detector
Elstar in-column SE/BSE detector
Everhart-Thornley SE detector (ETD)
Retractable STEM3+ detector with BF/DF/HAADF segments
Gas Injection System
Easylift for precise in situ sample manipulation
AutoTEM wizard automated sample preparation
The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allow you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the In-lens & SE-Detector for high resolution images, the in-lens Energy selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for impressive material contrast of any samples, and Energy Dispersive Spectroscopy (EDS) for elemental analysis. We can use Ultra Plus in diverse scientific fields, including Materials and Geological Research: combined analytical procedures and retrieve of maximum amount of information from your sample and in Life Sciences to analyze samples easily with high throughput and get large volumes of data. Further, Ultra Plus also provides the option for analyzing biological specimen in natural state using Cryo attachment and Cathodoluminescence (CL) for mineralogical analysis.
Please send your request for SEM appointments to email@example.com
The FEI Quanta 3D FEG is a state-of-the-art Dual Beam machine combines traditional thermal emission scanning electron microscope (SEM) with focused ion beam (FIB). This combination allows the characterization of materials in 2D and 3D (tomography), TEM sample preparation (TEM Lamella), observations at the subsurface of the specimens (cross section imaging) and structural modification of sample surfaces at the micrometer to nanometer scale. The machine features three different vacuum modes (High Vacuum, Low Vacuum & Environmental Modes), which accommodates the widest range of samples for SEM analysis, it can be either dry inorganic samples or hydrated biological samples. It also has an EBSD detector for the crystallographic orientation analysis, grain and phase analysis of material and geological samples with an optional EDS detector for semi-quantitative, point & shoot chemical analyses.
Focused Ion Beam Column
Sample preparation instruments are available for all kinds of samples for scanning electron microscopes.
1) Gold-Palladium Sputter Coater - Leica
2) Carbon Coater - Leica
3) Cryo Sample Preparation - Leica