X-ray Computer Tomography
English only
Description:
- Ultra-high resolution CT system for non-destructive X-ray imaging and 3D-reconstruction of rocks (nanotom 180NF, GE phoenixIx-ray)
Specifications:
- Sample size: < 6 (12) cm
- X-ray tube: <180 kV, 880 µA (max. 15 W)
- X-ray detector: 5 Mpixel flat panel (12 bit resolution)
- Voxel-resolution: 0.5 – 30 µm (depending on sample size)
He Gas Pycnometry
Gas Adsorption Porosimetry
Mercury Porosimetry
BIB Cooling Cross Section Polisher
English only
Description:
- Broad Ion Beam (BIB) polisher (Jeol IB-19520CCP) operating with an Ar-Ion beam for damage-free preparation of 1 - 2 sq mm large, almost planar surfaces. This allows high-resolution SEM analysis of fine-grained material such as clays and shales, including detailed investigations of texture and fabric of their pores.
Specifications:
- Sample size: 10 x 8 x 3 mm
- Temperature: ~ -140 °C to 30 °C (coolant: liquid nitrogen)
- Acceleration voltage: 2 - 8 kV
- Milling speed: ~ 500 µm / hour