Powder X-ray diffractometer STOE StadiP
Contact: Dr. Pablo Forjanes, Rebecca Volkmann
Our powder X-ray diffractometer (XRD) consists of two individual instruments capable of X-ray scattering analysis using both Cu (λ=1.54 Å) and Ag radiation (λ=0.56 Å) in transmission geometry. XRD can be used to analyze both crystalline and amorphous samples by measuring either conventional diffraction patterns or high Q-range total scattering patterns for pair distribution function (PDF) analysis. Measurements can be performed in room or elevated temperature up to 800 ⁰C.
Cu radiation is more suitable for general structure analysis of crystalline samples. Samples may be analysed in either Debye-Scherrer (capillary) or flat plate geometries. Multi-sample changers are available for both geometries. The Cu-XRD is fitted with a curved Ge (111) monochromator in the incident beam and the scattered X-rays are detected with a DECTRIS MYTHEN2 R 1k photon counting detector.
Ag radiation is more suitable for PDF measurements or materials that are fluorescent in the Cu X-Ray radiation such as Fe-rich materials. Samples may be analyzed in either Debye-Scherrer (capillary) or flat plate geometries. A high temperature furnace is available for samples in Debye-Scherrer geometry. The Ag-XRD is fitted with a curved Ge (111) monochromator in the incident beam and the scattered X-rays are detected with two DECTRIS MYTHEN2 R 1k photon counting detectors.