Broad Ion Beam (BIB) polisher (Jeol IB-19520CCP) operating with an Ar-Ion beam for damage-free preparation of 1 - 2 sq mm large, almost planar surfaces. This allows high-resolution SEM analysis of fine-grained material such as clays and shales, including detailed investigations of texture and fabric of their pores.
Sample size: 10 x 8 x 3 mm
Temperature: ~ -140 °C to 30 °C (coolant: liquid nitrogen)
Acceleration voltage: 2 - 8 kV
Milling speed: ~ 500 µm / hour