BIB Cooling Cross Section Polisher

Description

Broad Ion Beam (BIB) polisher (Jeol IB-19520CCP) operating with an Ar-Ion beam for damage-free preparation of 1 - 2 sq mm large, almost planar surfaces. This allows high-resolution SEM analysis of fine-grained material such as clays and shales, including detailed investigations of texture and fabric of their pores.

Specifications

Sample size: 10 x 8 x 3 mm

Temperature: ~ -140 °C to 30 °C (coolant: liquid nitrogen)

Acceleration voltage: 2 - 8 kV

Milling speed: ~ 500 µm / hour