Laboratory for XRF Element Scanning
The laboratory for XRF (X-ray Fluorescence) Element Scanning focusses on non-destructive and continuous core analyses. These analyses allow detailed geochemical characterisation of complete sediment cores down to individual layers and grains. Bridging these scales is achieved by combining XRF core scanning, micro-XRF scanning of epoxy impregnated sediment blocks or thin sections, and Scanning Electron microscope (SEM) analyses.
The developments and research are focused on improving environmental and climatic interpretations by:
- Integrating XRF analyses with core and thin-section observations
- Geochemical proxies and sediment characterisation using multi-variate statistical analyses
![[Translate to English:] Grafik: R. Tjallingii](/fileadmin/_processed_/4/9/csm_Intro-MFM_a67ac52618.jpg)
Samples
- Split core sections up to 180 cm length and diameters between 6 and 12 cm
Analyses
- XRF system for non-destructive and continuous element records (Al through to Ba; 0.2 mm resolution)
- Line-scan camera for optical imaging and RGB recording
- X-ray camera and imaging
Technical specifications
- Cr (1.9 kW) or Mo (3 kW) X-ray tube
- Flat-beam wave guide to focus the X-ray beam onto the sample surface (rectangular spot area 0.2 x 22 mm)
- Peltier cooled Si-drift-detector and digital MCA (throughput 300x103 cps)
- more
Samples
- Polished and epoxy-embedded sediment samples, thick-sections and speleothem samples (sample stage 20 x 17 cm)
Analyses
- XRF system for ultra-high resolved element records and mapping (Na through to Ba; 20 µm)
- Optical imaging
Technical specifications
- Sample chamber (stage 20 x 17 cm) for analysis under vacuum
- Low power X-ray tube (Rh anode, max. power 0.03 kW)
- Capillar lens (VariSpot) for focusing the primary X-ray beam (spot size 20 µm)
- Dual 30 mm2 Si-Drift Detector (throughput 300x103 cps each)
- more
Samples
Uncoated samples up to 100 mm
Analyses
Scanning electron microscope with Energy Dispersive Spectroscopy Elementaranalyse
Technical specifications
- Optical magnification: 3-16x
- SEM magnification: 160 - 200k
- Operational voltage: 4,8 - 20,5 kV
- Vacuum: 1 Pa
- more
![[Translate to English:] Download Software](/fileadmin/_processed_/6/3/csm_Icons8_flat_download.svg_548a0ff7cf.webp)
- ITRAXelerate software here
