Inhaltsbereich
Publications
(Co) Author: Tegge-Schüring, A.
(since 2003) [ All ]
| Paper (ISI journals) [1] |
Chapter in Book [1] |
All [2] |
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(2005): Trace element diffusion in rhyolitic melts: Comparison between synchrotron radiation X-ray fluorescence microanalysis (ยต-SRXRF) and secondary ion mass spectrometry (SIMS). European Journal of Mineralogy, 17, 2, 233-242.
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(2003): Beamline L: White beam synchrotron radiation X-ray fluorescence microanalysis (m-SRXRF) compared with secondary ion mass spectrometry. Hasylab Annual Report 2003, HASYLAB, 1093-1094.| EDOC: 6140 |