X-Ray Fluorescence Spectrometry (XRF)

For XRF analysis the sample material is irradiated with X-rays, which excite secondary X-ray fluorescence. The secondary X-Rays have characteristic wavelengths produced by the elements of the sample material. The separation of individual wavelengths of the fluorescent x-ray emission is done by Bragg diffraction from crystals of particular lattice spacings. The intensity of the fluorescent radiation is proportional to the element concentrations in the sample. In quantitative analysis, intensities are compared with standards of known composition.

For routine XRF analysis, powdered sample material is fused to a glass disc for the major elements and some trace elements, and a separate pellet of pressed powder is used to analyse for the other trace elements.


Contact Person:  Rudolf Naumann


Equipment:

 

• PANalytical AXIOS Advanced
• End-window Rh X-ray tube SST-mAX with 4kW output
• Analyser crystals: LiF (220), PX1, PX8, PX10, Ge111 curved, PE002 curved
• Primary collimators: 150, 300 and 700 microns
• Collimator masks: 6, 10, 20, 27, 30, 37 millimetres
• Tube filters:  150 micron (Be), 100 micron (brass), 400 micron (brass), 750 micron (Al)
• Argon flow proportional and scintillation detectors, sealed Xe detector
• Dust collection device