Inhaltsbereich
SIMS Laboratory
Section 4.2 of Division 4 of the GeoForschungsZentrum Potsdam operates a fully equipped Secondary Ion Mass Spectrometer (SIMS) laboratory. Our facility is based around a Cameca ims 6f magnetic sector ion microprobe; this highly automated tool provides both isotopic and trace element information at the micron-scale. Both GFZ and external scientists are invited to submit project proposals for laboratory access. All external project are conducted on a collaborative basis, whereby a GFZ scientist must be identified as project participant and this scientist will be involved in the publication of all results which are obtained from the SIMS analyses. All project proposals are evaluated by the SIMS external steering committee, which evaluates these proposals based on technical feasibility, scientific excellence and the overall relevance of the project toward achieving the facility's benchmarks of excellence. Applicants whose projects are judge to be of the highest standard are invited to use the SIMS laboratory and will be provided with adequate machine time in order to achieve the stated project objectives.
The GeoForschungsZentrum is a member of the Helmholtz Society of Research Institutions.
If you wish to obtain access to the GeoForschungsZentrum Ion Microprobe (SIMS) Laboratory, please follow to
SIMS Basics
Ion microprobes, also know as secondary ion mass spectrometers (SIMS), use a finely focused ion beam to probe a selected sample domain. A small percentage of the material sputtered from the polished surface of the sample is ionized, and these ions are accelerated into a mass spectrometer where they are separated according to their mass-over-charge ratio. An important characteristic of SIMS is its high sensitivity compared to other microbeam sampling techniques: the ability to count individual ions results in detection limits in the parts-per-billion range for many elements. Also the fact that ions derived from the sample are separated by their mass-over-charge ratio means that isotopic analyses can be performed on very small sample volumes.
© gfz-potsdam- Backscattered electron image of a zircon crystal which in this example has a ~20µm diameter sputter crater produced during a 90 minute SIMS analysis. The size of the sputter crater varies between applications, but for most geologic applications ranges between 5 and 30µm in diameter. Electron Microscope image courtesy U. Glenz of the GFZ.
MEMBERS OF THE LABORATORY'S EXTERNAL STEERING COMMITTEE:
- Prof. Dr. Rainer Altherr (Chairperson): Mineralogisches Institut, Universität Heidelberg
- Prof. Dr. Klaus Mezger, Institut für Mineralogie, Universität Münster
- Prof. Dr. Dave Rubie, Bayerisches Geoinstitut, Bayreuth
- Prof. Dr. Hans. A. Seck, Mineralogisches Institut, Universität Köln
STAFF OF THE GFZ SIMS LABORATORY:
Dr. Michael Wiedenbeck tel: ++49-331-288-1484 michawi@gfz-potsdam.de Dr. Dieter Rhede tel: ++49-331-288-1475 rhede@gfz-potsdam.de Ilona Schäpan tel: ++49-331-288-1455 ilona@gfz-potsdam.de
Our Contact Address:
SIMS Laboratory
Section 4.2
GeoForschungsZentrum Potsdam
Telegrafenberg C164
D14473 Potsdam, GERMANY
tel: (++49-331) 288-1462
FAX: (++49-331) 288-1474
E-mail: SIMSlab@gfz-potsdam.de

