Inhaltsbereich
TEM: Focused Ion Beam (FIB) Laboratory
Focused Ion Beam Thinning allows:
- Preparation of site specific TEM foils of homogeneous thickness
- Nano-machining: drilling, cutting, polishing, etching
- Metal deposition (platinum)
TEM specimen preparation by "Focused Ion Beam thinning" (FIB)
FEI COMPANY
Contact person: Anja Schreiber, Richard Wirth