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(Co) Author: Tse, J. S.

(since 2010) [ All ]

| Paper (ISI journals) [1] | Conference Paper [3] | All [4] |

Paper (ISI journals)

Sahle, C. J.; Sternemann, C.; Nyrow, A.; Mende, K.; Wilke, M.; Schmidt, C.; Dubrail, J.; Tolan, M.; Simonelli, L.; Giordano, V.; Tse, J. S. (2011): Studying soft X-ray absorption edges under extreme conditions. Mineralogical Magazine, 75, 3, 1778.
| EDOC: 17401 |

Conference Paper

Mende, K.; Nyrow, A.; Sternemann, C.; Schmidt, C.; Wilke, M.; Simonelli, L.; Moretti Sala, M.; Hiraoka, N.; Gordon, R. A.; Sahle, C. J.; Brenner, T.; Tolan, M.; Tse, J. S. (2012): X-ray Raman Scattering: A spectroscopic tool to study low Z elements under high pressure and temperature. Conference Abstracts, 14th International Conference Experimental Mineralogy Petrology Geochemistry - EMPG (Kiel, Germany 2012), 106.
| EDOC: 18293 |

Nyrow, A.; Mende, K.; Sahle, C. J.; Schmidt, C.; Sternemann, C.; Wilke, M.; Simonelli, L.; Moretti Sala, M.; Hiraoka, N.; Wieland, D. C. F.; Gordon, R. A.; Tolan, M.; Tse, J. S. (2011): Study of silicate melts and iron oxides by x-ray Raman scattering. 7th European Conference on Mineralogy and Spectroscopy - ECMS 2011 (Potsdam, Germany 2011), 55.
| EDOC: 17526 |

Sahle, C. J.; Sternemann, C.; Tse, J. S.; Wilke, M.; Schmidt, C.; Nyrow, A.; Dubrail, J.; Giordano, V.; Simonelli, L.; Desgreniers, S.; Tolan, M. (2010): X-ray Raman scattering studies of Si based compounds under extreme conditions. 7th International Conference on Inelastic X-ray Scattering - IXS 2010 (Grenoble, France 2010).
| EDOC: 15862 |

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