Inhaltsbereich

Publications

(Co) Author: Ohrdorf, A.

| Chapter in Book [1] | All [1] |

Hahn, M.; Behrens, H.; Koepke, J.; Ohrdorf, A.; Rickers, K.; Falkenberg, G. (2002): Measurement of trace element diffusivities in silicic melts using SRXRF. Jahresbericht / Hamburger Synchrotronstrahlungslabor HASYLAB am Deutschen Elektronen-Synchrotron DESY = Annual report, HASYLAB, 945-946.
| EDOC: 6154 |