Inhaltsbereich

Publications

(Co) Author: Tegge-Schüring, A.

Hahn, M.; Tegge-Schüring, A.; Behrens, H.; Koepke, J.; Rickers, K.; Falkenberg, G.; Wiedenbeck, M. (2003): Beamline L: White beam synchrotron radiation X-ray fluorescence microanalysis (m-SRXRF) compared with secondary ion mass spectrometry. Hasylab Annual Report 2003, HASYLAB, 1093-1094.
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