Wordmark GFZ Potsdam

Publications

 
(Co) Author: Brenker, F.





  • Wirth, R. (2010): Focused Ion Beam (FIB): site-specific sample preparation, nano-analysis, nano-characterization and nano-machining. - In: Brenker, F. E.; Jordan, G. (Eds.), Nanoscopic approaches in Earth and planetary sciences.











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