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(Co) Author: Tegge-Schüring, A.

| Paper (ISI journals) [1] | Chapter in Book [1] | Conference Paper [2] | All [4] |

Paper (ISI journals)

Hahn, M.; Behrens, H.; Tegge-Schüring, A.; Koepke, J.; Horn, I.; Rickers, K.; Falkenberg, G.; Wiedenbeck, M. (2005): Trace element diffusion in rhyolitic melts: Comparison between synchrotron radiation X-ray fluorescence microanalysis (µ-SRXRF) and secondary ion mass spectrometry (SIMS). European Journal of Mineralogy, 17, 2, 233-242.
| EDOC: 7554 | 10.1127/0935-1221/2005/0017-0233 |

Chapter in Book

Hahn, M.; Tegge-Schüring, A.; Behrens, H.; Koepke, J.; Rickers, K.; Falkenberg, G.; Wiedenbeck, M. (2003): Beamline L: White beam synchrotron radiation X-ray fluorescence microanalysis (m-SRXRF) compared with secondary ion mass spectrometry. Hasylab Annual Report 2003, HASYLAB, 1093-1094.
| EDOC: 6140 |

Conference Paper

Tegge-Schüring, A.; Koepke, J.; Behrens, H.; Hahn, M.; Falkenberg, G.; Wiedenbeck, M. (2001): Measurement of trace element diffusivities: comparison between SYXRF and SIMS. DMG, 172.
| EDOC: 2908 |

Tegge-Schüring, A.; Koepke, J.; Falkenberg, G.; Wiedenbeck, M.; Behrens, H.; Hahn, M. (2001): Diffusion data of Cations in Silicate Melts Determined by SYXRF and SIMS. HASYLAB User Meeting.
| EDOC: 2907 |

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