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(Co) Author: Brenner, T.

| Paper (ISI journals) [1] | Conference Paper [1] | All [2] |

Paper (ISI journals)

Mende, K.; Nyrow, A.; Sternemann, C.; Schmidt, C.; Wilke, M.; Simonelli, L.; Moretti Sala, M.; Sahle, C.; Brenner, T.; Tse, J.; Tolan, M. (2012): Low energy absorption edges of NS3 glass, albite and silicon investigated using x-ray Raman scattering. Mineralogical Magazine, 76, 6, 2098.
| EDOC: 19013 |

Conference Paper

Mende, K.; Nyrow, A.; Sternemann, C.; Schmidt, C.; Wilke, M.; Simonelli, L.; Moretti Sala, M.; Hiraoka, N.; Gordon, R. A.; Sahle, C. J.; Brenner, T.; Tolan, M.; Tse, J. S. (2012): X-ray Raman Scattering: A spectroscopic tool to study low Z elements under high pressure and temperature. Conference Abstracts, 14th International Conference Experimental Mineralogy Petrology Geochemistry - EMPG (Kiel, Germany 2012), 106.
| EDOC: 18293 |

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