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Inhaltsbereich

Publications

 

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(Co) Author: Simonelli, L.

| Paper (ISI journals) [4] |  Conference Paper [6] |  All [10] |

  Conference Paper  

2012

• Mende, K.; Nyrow, A.; Sternemann, C.; Schmidt, C.; Wilke, M.; Simonelli, L.; Moretti Sala, M.; Hiraoka, N.; Gordon, R. A.; Sahle, C. J.; Brenner, T.; Tolan, M.; Tse, J. S. (2012): X-ray Raman Scattering: A spectroscopic tool to study low Z elements under high pressure and temperature. Conference Abstracts, 14th International Conference Experimental Mineralogy Petrology Geochemistry - EMPG (Kiel, Germany 2012), 106.
  
  | EDOC: 18293 | 

• Sahle, C. J.; Schmidt, C.; Sternemann, C.; Lehtola, J.; Wilke, M.; Jahn, S.; Pylkkänen, T.; Huotari, S.; Simonelli, L.; Nyrow, A.; Mende, K.; Hämäläinen, K. (2012): In situ spectroscopy of shallow absorption edges using hard x-rays. 1st European Mineralogical Conference - EMC (Frankfurt/Main, Germany 2012), EMC2012-108.
  
  | EDOC: 19097 | 

2011

• Nyrow, A.; Mende, K.; Sahle, C. J.; Schmidt, C.; Sternemann, C.; Wilke, M.; Simonelli, L.; Moretti Sala, M.; Hiraoka, N.; Wieland, D. C. F.; Gordon, R. A.; Tolan, M.; Tse, J. S. (2011): Study of silicate melts and iron oxides by x-ray Raman scattering. 7th European Conference on Mineralogy and Spectroscopy - ECMS 2011 (Potsdam, Germany 2011), 55.
  
  | EDOC: 17526 | 

• Sahle, C. J.; Schmidt, C.; Sternemann, C.; Wilke, M.; Simonelli, L.; Nyrow, A.; Mende, K.; Tolan, M. (2011): Structural changes of water at high pressure and high temperature: information from X-ray Raman scattering at the oxygen K-edge. 7th European Conference on Mineralogy and Spectroscopy - ECMS 2011 (Potsdam, Germany 2011), 65.
  
  | EDOC: 17527 | 

• Sternemann, C.; Mende, K.; Nyrow, A.; Sahle, C. J.; Wilke, M.; Schmidt, C.; Simonelli, L.; Moretti Sala, M.; Tolan, M. (2011): X-ray Raman scattering: A spectroscopic tool for in-situ studies of low Z element's absorption edges at high pressure and high temperature. 7th European Conference on Mineralogy and Spectroscopy - ECMS 2011 (Potsdam, Germany 2011), 80.
  
  | EDOC: 17532 | 

2010

• Sahle, C. J.; Sternemann, C.; Tse, J. S.; Wilke, M.; Schmidt, C.; Nyrow, A.; Dubrail, J.; Giordano, V.; Simonelli, L.; Desgreniers, S.; Tolan, M. (2010): X-ray Raman scattering studies of Si based compounds under extreme conditions. 7th International Conference on Inelastic X-ray Scattering - IXS 2010 (Grenoble, France 2010).
  
  | EDOC: 15862 | 

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