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Publications

 

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(Co) Author: Giordano, V.

| Paper (ISI journals) [1] |  Conference Paper [1] |  All [2] |

  Paper (ISI journals)  

2011

• Sahle, C. J.; Sternemann, C.; Nyrow, A.; Mende, K.; Wilke, M.; Schmidt, C.; Dubrail, J.; Tolan, M.; Simonelli, L.; Giordano, V.; Tse, J. S. (2011): Studying soft X-ray absorption edges under extreme conditions. Mineralogical Magazine, 75, 3, 1778.
  
  | EDOC: 17401 | 

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  Conference Paper  

2010

• Sahle, C. J.; Sternemann, C.; Tse, J. S.; Wilke, M.; Schmidt, C.; Nyrow, A.; Dubrail, J.; Giordano, V.; Simonelli, L.; Desgreniers, S.; Tolan, M. (2010): X-ray Raman scattering studies of Si based compounds under extreme conditions. 7th International Conference on Inelastic X-ray Scattering - IXS 2010 (Grenoble, France 2010).
  
  | EDOC: 15862 | 

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