TEM: Focused Ion Beam (FIB) Laboratory

Focused Ion Beam Thinning allows:

  • Preparation of site specific TEM foils of homogeneous thickness
  • Nano-machining: drilling, cutting, polishing, etching
  • Metal deposition (platinum)
TEM specimen preparation by "Focused Ion Beam thinning" (FIB)
TEM specimen preparation by "Focused Ion Beam thinning" (FIB)

Contact

Mr. Dr. Richard Wirth
Chemistry and Physics of Earth Materials

Telegrafenberg
Building C, room 120
14473 Potsdam
tel. +49 331 288-1371

Ms. Anja Schreiber
Geomechanics and Rheology

Telegrafenberg
Building C, room 155
14473 Potsdam
tel. +49 331 288-1372