Single crystal X-ray diffractometer

The positions in space and their intensities of the diffracted X-ray beam provide structural information from crystalline materials. Such with a single crystal diffractometer the structures of minerals can be determined.

Besides structure determination we use the diffractometer to find the spatial orientations of crystals and for the indentification of phases or aggregates in the μm-size range.

The diffractometer is a Rigaku Spider system. The source of the single crystal X-ray diffractometer is a rotating anode which emits a very intense Cu radiation which is made monochromatic to yield Cu Kα radiation by an optical system of mirrors. Due to the high intensity of the source for single crystal measurements the size of individual mounts need only to be 20 μm or can be even smaller. The detection system consists of a cylindric image plate which spans 204° 2θ from -60 to 144°.


  • Rigaku Spider
  • rotating Cu anode
  • monochromatic Cu Kα radiation (Rigaku Osmic VariMax HF system)
  • 40 kV accelerating voltage
  • 30 mA beam current
  • smallest beam size 100 μm
  • partial χ-goniometer (χ from -16 to 56°, ω from -85 to 265°, ϕ from 0 to 360°)
  • cylindric image plate from -60 to 144° 2θ
  • Aperture: 466 mm x 256 mm
  • Pixel size: 100 μm x 100 μm
  • Read time: 51.2 seconds
  • Erase time: 20 seconds
  • CrystalClear and CrystalStructure software
Single crystal X-ray diffractometer
Single crystal X-ray diffractometer


Mr. Prof. Dr. Matthias Gottschalk
Chemistry and Physics of Earth Materials

Building D, room 322
14473 Potsdam
tel. +49 331 288-1418

Mr. Hans-Peter Nabein
Chemistry and Physics of Earth Materials

Building D, room 362
14473 Potsdam
tel. +49 331 288-1454